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Search for "Kelvin probe modelling" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.
Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives
Beilstein J. Nanotechnol. 2023, 14, 725–737, doi:10.3762/bjnano.14.59
- photogenerated carrier distributions. The analysis of the KPFM data was assisted by means of theoretical modelling simulating the energy bands profile and KPFM measurements. Keywords: FM-KPFM; frequency-modulated Kelvin probe force microscopy; III–V multilayer stack; Kelvin probe modelling; KP modelling; SPV
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